CHEKEMBOU, M. S.; OMRANE, M.; MOKRANI, L.; MEDJGHOU, A.; NAIMI, D.; MILOUDI, K. An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices. Engineering, Technology & Applied Science Research, Greece, v. 16, n. 2, p. 33351–33358, 2026. DOI: 10.48084/etasr.17081. Disponível em: https://mail.etasr.com/index.php/ETASR/article/view/17081. Acesso em: 17 apr. 2026.