KULKARNI, S.; PATIL, P. A Comprehensive Within-Subject Analysis of EEGNet for SEED-IV Emotion Recognition: Subject Variability and Per-Class Performance. Engineering, Technology & Applied Science Research, Greece, v. 16, n. 2, p. 34403–34408, 2026. DOI: 10.48084/etasr.17161. Disponível em: https://mail.etasr.com/index.php/ETASR/article/view/17161. Acesso em: 17 apr. 2026.