DINH, Hoang Long; DOAN, Diem Vuong; NGUYEN, Ngoc Khoat; NGUYEN, Duy Trung; HOANG, Huy Hoang. Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach. Engineering, Technology & Applied Science Research, Greece, v. 16, n. 3, p. 36545–36551, 2026. DOI: 10.48084/etasr.18859. Disponível em: https://mail.etasr.com/index.php/ETASR/article/view/18859. Acesso em: 8 jun. 2026.